Development of high speed driver for electron beam scanning coil

In order to meet the need of high speed deflection scanning of electron beam,a high speed driver for electron beam scanning coil was developed. Specifically,the driver input stage circuit was designed by means of voltage reduction,compensation and differential input to improve the response and processing speed of the circuit to high-speed signals. The current closed-loop regulating circuit was designed by emitter following to improve the closed-loop regulating speed and stability of the circuit. The circuit simulation analysis and parameter optimization were done by Cadence simulation. According to the above results,a high-speed driver for electron beam scanning coil was developed and tested.The results showed that the output current could respond to any input signal in a high-speed closed-loop manner when the inductive load was drove. The operating frequency could reach 100 k Hz and the maximum driving current was ±2 A.